Methods

  1. 20.03.2017 Acknowledging publications
  2. 30.01.2017 Acknowledging publications
  3. Absorption spectroscopy
  4. Dynamic light scattering
  5. Luminescence spectroscopy
  6. The Fourier Transform Infrared Spectroscopy (FT-IR)
  7. The Raman scattering spectroscopy
  8. Zeta potential measurement principle (Laser Doppler Electrophoresis)
  9. Determination of porosity of different samples
  10. High-resolution X-ray diffraction and defectoscopy
  11. Powder X-ray diffraction analysis
  12. Real-Time Measurement of Stable Isotope Ratios in H2O with Picarro L-2120i
  13. Single crystal X-ray diffraction analysis
  14. Spectroscopy. IR spectroscopy, DSC, TGA
  15. Thermal X-ray analysis
  16. Atomic layer deposition (ALD)
  17. Ceramics production by hot pressing.
  18. Matrix synthesis of grafted organic compounds
  19. Allelic Discrimination (Applied Biosystems 7500 Fast Real Time PCR System)
  20. Gene expression (Applied Biosystems 7500 Fast Real Time PCR System)
  21. Implen NanoPhotometer P360
  22. KRYO 560-16
  23. Nextera
  24. QIAcxel Advanced
  25. QIAxcel
  26. Quantus™ Fluorometer
  27. Chemisorption studies
  28. Differential Scanning Calorimetry (DSC)
  29. Dynamic Vapor Sorption (DVS)
  30. Isothermal Calorimetry (IC)
  31. Isothermal Titration Calorimetry (ITC)
  32. Simultaneous Thermal Analysis (STA)
  33. Standard Porometry (SP)
  34. Thermogravimetric Analysis (TGA)
  35. Thermomechanical Analysis (TMA)
  36. Technique of elemental and chemical analysis of solids by the method of photoelectron spectroscopy of core levels
  37. Technique of permanent deposition of different metals with a continuous control of the thickness of deposited layers during realization of R&D
  38. Technique of synthesis of graphene by chemical vapor deposition.
  39. Technique of testing of the crystal structure of monocrystal surfaces and their orientation for researches by method of photoelectron spectroscopy with angular resolution by high-resolved details of LEED patterns during realization of R&D
  40. Technique of the raster depth profiling
  41. Technique of the surface cleaning of monocrystals of refractory and transition metals up to atomic cleanliness during realization of R&D
  42. The technique of measuring of the dispersion of the energy band structure and occupied and unoccupied state by the photoelectron spectra with high angular and energy resolution during realization of R&D
  43. Atomic force microscopy (AFM) (contact and non-contact modes)
  44. Auger electron spectroscopy (AES) and scanning auger electron mapping (SAM)
  45. Ion scattering spectroscopy (ISS)
  46. Low