The method allows to obtain images of surface of samples (including the non-conductive samples) using both cantilevers and Q-plus sensors. In the latter mode STM images can be obtained sumultaneously with AFM imaging with atomic resolution.
The method allows to obtain images of surface of samples (including the non-conductive samples) using both cantilevers and Q-plus sensors. In the latter mode STM images can be obtained sumultaneously with AFM imaging with atomic resolution.
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