Methods
- 20.03.2017 Acknowledging publications
- 30.01.2017 Acknowledging publications
- Absorption spectroscopy
- Dynamic light scattering
- Luminescence spectroscopy
- The Fourier Transform Infrared Spectroscopy (FT-IR)
- The Raman scattering spectroscopy
- Zeta potential measurement principle (Laser Doppler Electrophoresis)
- Determination of porosity of different samples
- High-resolution X-ray diffraction and defectoscopy
- Powder X-ray diffraction analysis
- Real-Time Measurement of Stable Isotope Ratios in H2O with Picarro L-2120i
- Single crystal X-ray diffraction analysis
- Spectroscopy. IR spectroscopy, DSC, TGA
- Thermal X-ray analysis
- Atomic layer deposition (ALD)
- Ceramics production by hot pressing.
- Matrix synthesis of grafted organic compounds
- Allelic Discrimination (Applied Biosystems 7500 Fast Real Time PCR System)
- Gene expression (Applied Biosystems 7500 Fast Real Time PCR System)
- Implen NanoPhotometer P360
- KRYO 560-16
- Nextera
- QIAcxel Advanced
- QIAxcel
- Quantus™ Fluorometer
- Chemisorption studies
- Differential Scanning Calorimetry (DSC)
- Dynamic Vapor Sorption (DVS)
- Isothermal Calorimetry (IC)
- Isothermal Titration Calorimetry (ITC)
- Simultaneous Thermal Analysis (STA)
- Standard Porometry (SP)
- Thermogravimetric Analysis (TGA)
- Thermomechanical Analysis (TMA)
- Technique of elemental and chemical analysis of solids by the method of photoelectron spectroscopy of core levels
- Technique of permanent deposition of different metals with a continuous control of the thickness of deposited layers during realization of R&D
- Technique of synthesis of graphene by chemical vapor deposition.
- Technique of testing of the crystal structure of monocrystal surfaces and their orientation for researches by method of photoelectron spectroscopy with angular resolution by high-resolved details of LEED patterns during realization of R&D
- Technique of the raster depth profiling
- Technique of the surface cleaning of monocrystals of refractory and transition metals up to atomic cleanliness during realization of R&D
- The technique of measuring of the dispersion of the energy band structure and occupied and unoccupied state by the photoelectron spectra with high angular and energy resolution during realization of R&D
- Atomic force microscopy (AFM) (contact and non-contact modes)
- Auger electron spectroscopy (AES) and scanning auger electron mapping (SAM)
- Ion scattering spectroscopy (ISS)
- Low energy electron difraction (LEED)
- Optical spectroscopy (range from ultraviolet through infrared)
- Reflected electron energy loss spectroscopy (REELS)
- Reflectron time-of-flight mass spectrometry (TOF-MS)
- Scanning electron microscopy (SEM)
- Scanning tunneling microscopy (STM) and scanning tunneling spectroscopy (STS)
- Spin and angle resolved photoelectron spectroscopy (SARPES) of valence band
- Thermal desorption spectroscopy (TDS)
- X-ray photoelectron spectroscopy (XPS) and X-Ray photoelectron imaging (XPi)
- ATOMIC-FORCE MICROSCOPY
- LASER SCANNING CONFOCAL MICROSCOPY
- SCANNING ELECTRON MICROSCOPY AND ELECTRON-PROBE MICROANALYSIS
- DNA, RNA and protein quantitation technique
- Electron Microscopy Sample Preparation
- Flow cytometry technique
- Methods of analysis of plant and animal metabolites
- Optical microscopy
- Electron microscopy technique
- High-resolution light and fluorescence microscopy
- Image processing for the analysis of microscopy results
- Laser scanning microscopy
- Molecular and cell biology probe preparation
- Centrifugation
- Fluorescence spectroscopy
- Spectrophotometry and colorimetry
- 1D liquid-state NMR experiments
- 2D liquid-state NMR experiments
- EPR experiments
- NMR in zero field experiments
- Nuclear Quadrupolar Resonance (NQR) experiments
- Solid-state NMR experiments
- Atomic-force microscopy
- Dip-coating
- Electron beam lithography
- Hall measurements using Van der Pauw method
- Hydrothermal chemical synthesis
- Ion beam lithography
- Ion beam microscopy
- Laser photolithography
- Microwave chemical synthesis
- Molecular beam epitaxy
- Photoluminescence spectroscopy
- Plasma cleaning
- Plasma etching
- Reflection spectroscopy
- Scanning electron microscopy (SEM)
- Secondary ion mass spectrometry with gallium focused ion beam
- Spin noise spectroscopy
- Spin-coating
- Thermal evaporation
- Ultrahigh-speed coherent response spectroscopy
- Ultrasonic chemical synthesis
- Determination of phosphate ions in soils
- MEASUREMENT PROCESS M-K5-SM25
- Method of infrared (IR) spectroscopy