Details

Category: Electron microscopy

Hits: 1637

Jeol JEM-1400 Transmission Electron Microscope (with an acceleration voltage of 40-120 кВ).

For specifications visit www.jeol.com.

Details

Category: Electron microscopy

Hits: 1837

Jeol JEM-2100HC Transmission Electron Microscope (with an accelaration voltage of 80-200 кВ).

For specifications visit www.jeol.com.

Details

Category: Electron microscopy

Hits: 1947

The device provides moisture elimination from photoplates applied on the TEM Jeol JEM-1400 and JEM-2100. The procedure is not necessary for electron-sensitive imaging plates applied together with the DitaBis MicronVario detection system.

Details

Category: Electron microscopy

Hits: 1834

The device is designed for sample and sample holder plasmic cleaning from hydrocarbon contamination.

Details

Category: Electron microscopy

Hits: 1768

The device provides hydrophilization of carbonic support films, SEM sample holders and diamond knifes for ultratomy optimization.