The device provides moisture elimination from photoplates applied on the TEM Jeol JEM-1400 and JEM-2100. The procedure is not necessary for electron-sensitive imaging plates applied together with the DitaBis MicronVario detection system.
The device provides moisture elimination from photoplates applied on the TEM Jeol JEM-1400 and JEM-2100. The procedure is not necessary for electron-sensitive imaging plates applied together with the DitaBis MicronVario detection system.
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