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Category: Electron microscopy

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Jeol JEM-1400 Transmission Electron Microscope (with an acceleration voltage of 40-120 кВ).

For specifications visit www.jeol.com.

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Category: Electron microscopy

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Jeol JEM-2100HC Transmission Electron Microscope (with an accelaration voltage of 80-200 кВ).

For specifications visit www.jeol.com.

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Category: Electron microscopy

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The device provides moisture elimination from photoplates applied on the TEM Jeol JEM-1400 and JEM-2100. The procedure is not necessary for electron-sensitive imaging plates applied together with the DitaBis MicronVario detection system.

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Category: Electron microscopy

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The device is designed for sample and sample holder plasmic cleaning from hydrocarbon contamination.

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Category: Electron microscopy

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The device provides hydrophilization of carbonic support films, SEM sample holders and diamond knifes for ultratomy optimization.