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- Category: Equipment of Centre for Innovative Technologies of Composite Nanomaterials
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Energy dispersive X-ray fluorescence spectrometer EDX Series 800 HS (Shimadzu) is designed for rapid analysis of the elemental composition of the samples. Element detection range – from carbon to uranium.
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- Category: Equipment of Centre for Innovative Technologies of Composite Nanomaterials
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Spectral ellipsometry complex "Ellipse 1891 SAG" (wavelength range 350-1000 nm) is designed for precision measurements of the thickness of single-layer and multilayer thin-film structures, as well as investigation of the spectral optical constants (refractive index and absorption coefficient), the structural material properties (porosity, the presence of, and the concentration distribution of impurities in the film) over the entire spectral range.
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- Category: Equipment of Centre for Innovative Technologies of Composite Nanomaterials
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Agilent B1500A device in conjunction with the probe station RM-5 (Cascade Microtech) allows measurement of electrical properties of semiconductor structures (current-voltage and capacitance-voltage characteristics).
