Energy dispersive X-ray fluorescence spectrometer EDX Series 800 HS (Shimadzu) is designed for rapid analysis of the elemental composition of the samples. Element detection range – from carbon to uranium.


EDX spectrometer series designed for rapid non-destructive qualitative and quantitative determination of the elemental composition of solid and liquid samples, powders, granules, wafers, films.

Element detection range from C to U.

- Large cuvette camera is designed for the analysis of samples with a diameter of 300 mm and a height of 150 mm.

- The software allows you to determine the thickness and elemental composition of thin films and coatings. Background method allows to analyze the fundamental parameters of the organic nature of the film.

- Five types of primary filters minimize the effect of the background, which increases the signal / noise ratio and improves detection limits of elements in samples of different nature.

- The program uses a library of mapping data and eliminates the need for standard samples for quantitative analysis.

- The assay can be conducted in air, vacuum or helium environment (for determination of light elements in liquids).

- Liquid nitrogen is only required at the time of measurement.

- Digital camera (option) is designed to monitor the size of the sample analyzed in the research process.

- The use of collimators (optional) allows the analysis of micro- and defects in the samples as well as to reduce the background in the study of small-sized samples.

Technical characteristics

Range of elements

6C – 92U

X-ray generator

anode tube with Rh, air cooling voltage 5-50 kV, current 1-1 000 mA

The irradiated area

diameter 10 mm

Collimators (optional)

automatic selection of four types: 1, 3, 5 and 10 mm, or 0.3, 1, 3 and 10 mm


Si (Li), the liquid nitrogen is only necessary for the measurement, the flow rate of 1 l/day

Sample compartment

- analysis in air, vacuum or helium environment (optional) - 8 or 16-position autosampler - device for rotating the sample - a prefix for fine adjustment of the sample (optional) - a digital camera for observing the sample (optional)

Qualitative analysis

automatic and manual mode decryption peaks

Quantitative analysis

method of calibration curves-matrix correction method of fundamental parameters (FP) – a method of background FP-analysis of thin films by FP.


580 х 650 х 420 mm


85 kg