Energy dispersive X-ray fluorescence spectrometer EDX Series 800 HS (Shimadzu) is designed for rapid analysis of the elemental composition of the samples. Element detection range - from carbon to uranium.

 

EDX spectrometer series designed for rapid non-destructive qualitative and quantitative determination of the elemental composition of solid and liquid samples , powders , granules, wafers , films.

Element detection range from C to U

- Large cuvette camera is designed for the analysis of samples with a diameter of 300 mm and a height of 150 mm.

- The software allows you to determine the thickness and elemental composition of thin films and coatings . Background method allows to analyze the fundamental parameters of the organic nature of the film .

- Five types of primary filters minimize the effect of the background , which increases the signal / noise ratio and improves detection limits of elements in samples of different nature.

- The program uses a library of mapping data and eliminates the need for standard samples for quantitative analysis.

- The assay can be conducted in air, vacuum or helium environment (for determination of light elements in liquids ) .

- Liquid nitrogen is only required at the time of measurement

- Digital Camera ( option) is designed to monitor the size of the sample analyzed in the research process .

- The use of collimators (optional) allows the analysis of micro- and defects in the samples as well as to reduce the background in the study of small-sized samples .

 

Technical characteristics:

Range of elements:

6C – 92U

X-ray generator:

anode tube with Rh, air cooling voltage 5 - 50 kV, current 1 - 1000 mA

The irradiated area:

diameter 10 mm

Collimators (optional):

automatic selection of four types: 1, 3, 5 and 10 mm, or 0.3, 1, 3 and 10 mm

detectors:

 

 Si (Li), the liquid nitrogen is only necessary for the measurement, the flow rate of 1 L / day

Sample compartment:

- Analysis in air, vacuum or helium environment (optional) - 8 or 16-position autosampler - device for rotating the sample - a prefix for fine adjustment of the sample (optional) - a digital camera for observing the sample (optional)

Qualitative analysis:

automatic and manual mode decryption peaks

Quantitative analysis:

Method of calibration curves-matrix correction method of fundamental parameters (FP) - a method of background FP-analysis of thin films by FP

dimensions:

580 х 650 х  420 мм

weight

85 кг