Jeol JEM-1400 Transmission Electron Microscope (with an acceleration voltage of 40-120 кВ)

For specifications visit www.jeol.com.

Jeol JEM-1400 STEM

 

Jeol JEM-2100HC Transmission Electron Microscope (with an accelaration voltage of 80-200 кВ)

For specifications visit www.jeol.com.

Jeol JEM-2100

 

The device provides moisture elimination from photoplates applied on the TEM Jeol JEM-1400 and JEM-2100. The procedure is not necessary for electron-sensitive imaging plates applied together with the DitaBis MicronVario detection system.

jeol-em-dsc30.png

The device is designed for sample and sample holder plasmic cleaning from hydrocarbon contamination.

jeol-jic410.jpg

 

The device provides hydrophilization of carbonic support films, SEM sample holders and diamond knifes for ultratomy optimization.

jeol-hdt-400.jpg