Jeol JEM-1400 Transmission Electron Microscope (with an acceleration voltage of 40-120 кВ)

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Jeol JEM-1400 STEM


Jeol JEM-2100HC Transmission Electron Microscope (with an accelaration voltage of 80-200 кВ)

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Jeol JEM-2100


The device provides moisture elimination from photoplates applied on the TEM Jeol JEM-1400 and JEM-2100. The procedure is not necessary for electron-sensitive imaging plates applied together with the DitaBis MicronVario detection system.


The device is designed for sample and sample holder plasmic cleaning from hydrocarbon contamination.



The device provides hydrophilization of carbonic support films, SEM sample holders and diamond knifes for ultratomy optimization.